Low-Temperature (LT) Scanning Probe Microscope (SPM)

Brookhaven National Laboratory, a Department of Energy contractor, is soliciting proposals for the integration of a Low-Temperature Scanning Probe Microscope (LT-SPM) into an existing multiprobe ultra-high vacuum (UHV) surface analysis system. This procurement focuses on the design and development of an LT-SPM that maintains all original system functionality while incorporating a new SPM scanner, a sample stage with seven additional electrical contacts, and a removable magnetic field assembly. The supplier will design and construct a UHV SPM chamber in collaboration with Center for Functional Nanomaterials (CFN) staff to facilitate seamless sample and tip transfers. The system will utilize an existing cryostat and must remain compatible with an existing Scienta Omicron MATRIX SPM controller.

The project involves the installation of all internal electronics, wiring, and cabling at the CFN facility in Upton, New York. Upon completion, the supplier is required to perform performance and quality tests on an Au(111) crystal or graphite surface to confirm atomic resolution for both Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). This requirement is categorized under NAICS 334516, Analytical Laboratory Instrument Manufacturing, and PSC 6635, Physical Properties Testing and Inspection.

This combined synopsis/solicitation, identified as solicitation number BSA475591, has no assigned set-aside. Interested parties must submit their responses by the deadline of June 23, 2026. The contracting point of contact for this notice is Mark Brock. Seven attachments are included with the solicitation, such as the quotation pricing sheet, representations and certifications, and ACH authorization forms.